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Номер части | MFG | Техническая спецификация | Описание | Q'ty | Датакод | Расположение | Рег Дата | RFQ |
SN74BCT8240ADW
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Texas Inst |
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IC SCAN TEST DEVICE BUFF 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8240ANT
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Texas Inst |
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IC SCAN TEST DEVICE BUFF 24-DIP | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8244ADW
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Texas Inst |
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IC SCAN TEST DEVICE BUFF 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8244ANT
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Texas Inst |
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IC SCAN TEST DEVICE BUFF 24-DIP | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8245ADW
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Texas Inst |
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IC SCAN TEST DEVICE TXRX 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8245ANT
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Texas Inst |
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IC SCAN TEST DEVICE TXRX 24-DIP | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8373ADW
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Texas Inst |
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IC SCAN TEST DEVICE LATCH 24SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8373ANT
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Texas Inst |
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IC SCAN TEST DEVICE LATCH 24-DIP | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8374ADW
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Texas Inst |
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IC SCAN TEST DEVICE W/FF 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8374ANT
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Texas Inst |
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IC SCAN TEST DEVICE W/FF 24-DIP | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8240ADWR
![]() |
Texas Inst |
![]() |
IC SCAN TEST DEVICE BUFF 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
![]() |
SN74BCT8244ADWR
![]() |
Texas Inst |
![]() |
IC SCAN TEST DEVICE BUFF 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
![]() |
SN74BCT8245ADWR
![]() |
Texas Inst |
![]() |
IC SCAN TEST DEVICE TXRX 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
![]() |
SN74BCT8373ADWR
![]() |
Texas Inst |
![]() |
IC SCAN TEST DEVICE LATCH 24SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
![]() |
SN74BCT8374ADWR
![]() |
Texas Inst |
![]() |
IC SCAN TEST DEVICE W/FF 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8240ANTG4
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Texas Inst |
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IC SCAN TEST DEVICE BUFF 24-DIP | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8244ADWE4
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Texas Inst |
![]() |
IC SCAN TEST DEVICE BUFF 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8244ANTG4
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Texas Inst |
![]() |
IC SCAN TEST DEVICE BUFF 24-DIP | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
![]() |
SN74BCT8245ANTG4
![]() |
Texas Inst |
![]() |
IC SCAN TEST DEVICE TXRX 24-DIP | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
![]() |
SN74BCT8374ANTG4
![]() |
Texas Inst |
![]() |
IC SCAN TEST DEVICE W/FF 24-DIP | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8240ADWRE4
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Texas Inst |
![]() |
IC SCAN TEST DEVICE BUFF 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8240ADWRG4
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Texas Inst |
![]() |
IC SCAN TEST DEVICE 24SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8373ADWRE4
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Texas Inst |
![]() |
IC SCAN TEST DEVICE LATCH 24SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8373ADWRG4
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Texas Inst |
![]() |
IC SCAN TEST DEVICE 24SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8374ADWRE4
![]() |
Texas Inst |
![]() |
IC SCAN TEST DEVICE W/FF 24-SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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SN74BCT8374ADWRG4
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Texas Inst |
![]() |
IC SCAN TEST DEVICE 24SOIC | 45120 | 2022 | In.USA.Stock | 24-08-23 |
Цитата
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